Transistor Testers

Laboratory transistor test sets are used in experimental work to test all characteristics of transistors. For maintenance and repair, however, it is not necessary to check all of the transistor parameters. A check of two or three performance characteristics is usually sufficient to determine whether a transistor needs to be replaced. Two of the most important parameters used for transistor testing are the transistor current gain (beta) and the collector leakage or reverse current (I_co).

The semiconductor test set (fig. 2-4) is a rugged, field type of tester designed to test transistors and semiconductor diodes. The set measures the beta of a transistor, resistance appearing at the electrodes, reverse current of a transistor or semiconductor diode, shorted or open conditions of a diode, forward transconductance of a field-effect transistor, and condition of its own batteries.

Figure 2-4. - Semiconductor test set.

In order to assure that accurate and useful information is gained from the transistor tester, the following preliminary checks of the tester should be made prior to testing any transistors.

With the POLARITY switch (fig. 2-4) in the OFF position, the meter pointer should indicate exactly zero. (When required, rotate the meter adjust screw on the front of the meter to fulfill this requirement.) When measurements are not actually being made, the POLARITY switch must always be left in the OFF position to prevent battery drain.

Always check the condition of the test set batteries by disconnecting the test set power cord, placing the POLARITY switch in the PNP position and placing the FUNCTION switch first to BAT.1, then to BAT.2. In both BAT positions the meter pointer should move so as to indicate within the red BAT range.

BETA MEASUREMENTS. - If the transistor is to be tested out of the circuit, plug it into the test jack located on the right-hand side below the meter shown in figure 2-4. If the transistor is to be tested in the circuit, it is imperative that at least 300 ohms exist between E-B, C-B, and C-E for accurate measurement. Initial settings of the test set controls are as follows:

• FUNCTION switch to BETA
• POLARITY switch to PNP or NPN (dependent on type of transistor under test)
• RANGE switch to X10
• Adjust METER ZERO for zero meter indication (transistor disconnected)

NOTE: The POLARITY switch should remain OFF while the transistor is connected to or disconnected from the test set. If you determine that the beta reading is less than 10, reset the RANGE switch to X1 and reset the meter to zero.

After connecting the yellow test lead to the emitter, the green test lead to the base, and the blue test lead to the collector, plug the test probe (not shown) into the jack located at the lower right-hand corner of the test set. When testing grounded equipment, unplug the 115 vac line cord and use battery operation. The beta reading is attained by multiplying the meter reading times the RANGE switch setting. Refer to the transistor characteristics book provided with the tester to determine if the reading is normal for the type of transistor under test.

ELECTRODE RESISTANCE MEASUREMENTS. - Connect the in-circuit probe test leads to the transistor with the yellow lead to the emitter, the green lead to the base, and the blue lead to the collector. Set the FUNCTION switch to the OHMS E-B position, and read the resistance between the emitter and base electrode on the center scale of the meter.

To read the resistance between the collector and base and the collector and emitter, set the FUNCTION switch to OHMS C-B and OHMS C-E. These in-circuit electrode resistance measurements are used to correctly interpret the in-circuit beta measurements. The accuracy of the BETA X1, X10 range is 15 percent only when the emitter-to-base load is equal to or greater than 300 ohms.

I_co MEASUREMENTS. - Adjust the METER ZERO control for zero meter indication. Plug the transistor to be tested into the jack or connect test leads to the device under test. Set the PNP/NPN switch to correspond with the transistor under test. Set the FUNCTION switch to I_co and the RANGE switch to X0.1, X1, or X10 as specified by the transistor data book for allowable leakage. Read the amount of leakage on the bottom scale, and multiply this by the range setting figure as required.

DIODE MEASUREMENTS. - Diode qualitative in-circuit measurements are attained by connecting the green test lead to the cathode and the yellow test lead to the anode. Set the FUNCTION switch to DIODE IN/CKT and the RANGE switch to X1. (Ensure that the meter has been properly zeroed on this scale.) If the meter reads down scale, reverse the POLARITY switch. If the meter reads less than midscale, the diode under test is either open or shorted. The related circuit impedance of this test is less than 25 ohms.

PRECAUTIONS. - Transistors, although generally more rugged mechanically than electron tubes, are susceptible to damage by excessive heat and electrical overload. The following precautions should be taken in servicing transistorized equipment:

Test equipment and soldering irons must be checked to make certain that there is no leakage current from the power source. If leakage current is detected, isolation transformers must be used. Ohmmeter ranges that require a current of more than 1 milliampere in the test circuit are not to be used for testing transistors. Battery eliminators should not be used to furnish power for transistor equipment because they have poor voltage regulation and, possibly, high ripple voltage. The heat applied to a transistor, when soldered connections are required, should be kept to a minimum by using a low-wattage soldering iron and heat shunts (such as long-nose pliers) on the transistor leads. All circuits should be checked for defects before a transistor is replaced. The power should be removed from the equipment before replacing a transistor or other circuit part. When working on equipment with closely spaced parts, you will find that conventional test probes are often the cause of accidental short circuits between adjacent terminals. Momentary short circuits, which rarely cause damage to an electron tube, may ruin a transistor. To avoid accidental shorts, a test probe can be covered with insulation for all but a very short length of the tip.

Electrostatic Discharge Sensitive (ESDS) Care Devices that are sensitive to electrostatic discharge (ESD) require special handling. You can readily identify ESD-sensitive (ESDS) devices by the symbols shown in figure 2-5. Static electricity is created whenever two substances (solid or fluid) are rubbed together or separated. The rubbing or separating of substances causes the transfer of electrons from one substance to the other; one substance then becomes positively charged, and the other becomes negatively charged. When either of these charged substances comes in contact with a grounded conductor, an electrical current flows until that substance is at the same electrical potential as ground.

Figure 2-5. - Warning symbols for ESDS devices.

You commonly experience static build-up during the winter months when you walk across a vinyl or carpeted floor. (Synthetics, especially plastics, are excellent generators of static electricity.) If you then touch a doorknob or any other conductor, an electrical arc to ground may result, and you may receive a slight shock. For you to experience such a shock, the electrostatic potential created must be 3,500 to 4,000 volts. Lesser voltages, although present and similarly discharged, normally are not apparent to your nervous system. Some typical measured static charges caused by various actions are shown in table 2-1.

Table 2-1. - Typical Measured Static Charges (in volts)

Q.10 At approximately what minimum voltage potential should you be able to feel an electrostatic discharge?