MOSFET (Depletion/Enhancement Type) Test

Using an ohmmeter set to the R X 100 scale, measure the resistance between the MOSFET drain and the source; then reverse the ohmmeter leads and take another reading. The readings should be equal, regardless of meter lead polarity. Connect the positive lead of the ohmmeter to the gate. Using the negative lead, measure the resistance between the gate and the drain and between the gate and the source. Both readings should show infinity. Disconnect the positive lead from the gate and connect the negative lead to the gate. Using the positive lead, measure the resistance between the gate and the drain; then measure it between the gate and the source. Both readings should show infinity. Disconnect the negative lead from the gate and connect it to the substrate. Using the positive lead, measure the resistance between the substrate and the drain and between the substrate and the source. Both of these readings should indicate infinity. Disconnect the negative lead from the substrate and connect the positive lead to the substrate. Using the negative lead, measure the resistance between the substrate and the drain and between the substrate and the source. Both readings should indicate a low resistance (about 1,000 ohms).

MOSFET (Enhancement Type) Test

Using an ohmmeter set to the R X 100 scale, measure the resistance between the drain and the source; then reverse the leads and take another reading between the drain and the source. Both readings should show infinity, regardless of meter lead polarity. Connect the positive lead of the ohmmeter to the gate. Using the negative lead, measure the resistance between the gate and the drain and then between the gate and the source. Both readings should indicate infinity. Disconnect the positive lead from the gate and connect the negative lead to the gate. Using the positive lead, measure the resistance between the gate and the drain and then between the gate and the source. Both readings should indicate infinity. Disconnect the negative lead from the gate and connect it to the substrate. Using the positive lead, measure the resistance between the substrate and the drain and between the substrate and the source. Both readings should indicate infinity. Disconnect the negative lead from the substrate and connect the positive lead to the substrate. Using the negative lead, measure the resistance between the substrate and the drain and between the substrate and the source. Both readings should indicate a low resistance (about 1,000 ohms).

INTEGRATED CIRCUIT (IC) TESTING

Integrated circuits (ICs) constitute an area of microelectronics in which many conventional electronic components are combined into high-density modules. Integrated circuits are made up of active and passive components, such as transistors, diodes, resistors, and capacitors. Because of their reduced size, use of integrated circuits can simplify otherwise complex systems by reducing the number of separate components and interconnections. Their use can also reduce power consumption, reduce the overall size of the equipment, and significantly lower the overall cost of the equipment concerned. Many types of integrated circuits are ESDS devices and should be handled accordingly.

Q.18 Name two advantages in using ICs.

Your IC testing approach needs to be somewhat different from that used in testing vacuum tubes and transistors. The physical construction of ICs is the prime reason for this different approach. The most frequently used ICs are manufactured with either 14 or 16 pins, all of which may be soldered directly into the circuit. It can be quite a job for you to unsolder all of these pins, even with the special tools designed for this purpose. After unsoldering all of the pins, you then have the tedious job of cleaning and straightening all of them.

Although there are a few IC testers on the market, their applications are limited. Just as transistors must be removed from the circuit to be tested, some ICs must also be removed to permit testing. When ICs are used in conjunction with external components, the external components should first be checked for proper operation. This is particularly important in linear applications where a change in the feedback of a circuit can adversely affect operating characteristics of the component.

Any linear (analog) IC is sensitive to its supply voltage. This is especially the case among ICs that use bias and control voltages in addition to a supply voltage. If you suspect a linear IC of being defective, all voltages coming to the IC must be checked against the manufacturer's circuit diagram of the equipment for any special notes on voltages. The manufacturer's handbook will also give you recommended voltages for any particular IC.

When troubleshooting ICs (either digital or linear), you cannot be concerned with what is going on inside the IC. You cannot take measurements or conduct repairs inside the IC. You should, therefore, consider the IC as a black box that performs a certain function. You can check the IC, however, to see that it can perform its design functions. After you check static voltages and external components associated with the IC, you can check it for dynamic operation. If it is intended to function as an amplifier, then you can measure and evaluate its input and output. If it is to function as a logic gate or combination of gates, it is relatively easy for you to determine what inputs are required to achieve a desired high or low output. Examples of different types of ICs are provided in figure 2-23.

Figure 2-23. - Types of ICs.

Q.19 Why should you consider an IC as a black box?

Digital ICs are relatively easy for you to troubleshoot and test because of the limited numbers of input/output combinations involved. When using positive logic, the logic state of the inputs and outputs of a digital IC can only be represented as either a high (also referred to as a 1 state) or as a low (also referred to as a 0 state). In most digital circuitry, a high is a steady 5-vdc level, and a low is a 0-vdc level. You can readily determine the logic state of an IC by using high-input-impedence measuring devices, such as an oscilloscope. Because of the increased use of ICs in recent years, numerous pieces of test equipment have been designed specifically for testing ICs. They are described in the following paragraphs.

Q.20 What are the two logic states of an IC?

LOGIC CLIPS

Logic clips, as shown in figure 2-24, are spring-loaded devices that are designed to clip onto a dual-in-line package IC while the IC is mounted in its circuit. It is a simple device that usually has 16 light emitting diodes (LEDs) mounted at the top of the clips. The LEDs correspond to the individual pins of the IC, and any lit LED represents a high logic state. An unlit LED represents a low logic state. Logic clips require no external power connections, and they are small and lightweight. Their ability to simultaneously monitor the input and output of an IC is very helpful when you are troubleshooting a logic circuit.

Figure 2-24. - Logic clip.

Q.21 A lighted LED on a logic clip represents what logic level?

LOGIC COMPARATORS

The logic comparator, as shown in figure 2-25, is designed to detect faulty, in-circuit-DIP ICs by comparing them with ICs that are known to be good (reference ICs). The reference IC is mounted on a small printed-circuit board and inserted into the logic comparator. You then attach the logic comparator to the IC under test by a test lead, which is connected to a spring-loaded device similar in appearance to a logic clip. The logic comparator is designed to detect differences in logic states of the reference IC and the IC being tested. If any difference in logic states does exist on any pin, an LED corresponding to the pin in question will be lit on the logic comparator. The logic comparator is powered by the IC under test.

Figure 2-25. - Logic comparator.

Q.22 What does a lighted LED indicate on a logic comparator?